EDA Design Page 180

With the new NI Motion Assistant, you now can design a motion control application in an interactive 3D environment and convert it into C code for any C compiler, or into NI LabVIEW virtual instruments (VIs). NI Motion Assistant also exposes its patent-pending smart-contouring functionality with an API that you can call from C, Visual Basic, or LabVIEW. * Interactive environment with 3D visualization * Ready-to-run LabVIEW or C code creation * Easy trapezoidal or S-curve velocity profile implementation * Import Motion Profiles from CAD and drafting programs * Control stepper, servo, or piezo motor actuators * Single- or multiaxis application use Try NI Motion Assistant Today to Shorten Your Development TimeProduct:NI Motion 7.6 Lanaguage:english Platform:Winxp/Win7 Size:184MB

  NI(美国国家仪器公司)对外宣布针对LabVIEW推出NI SoftMotion Development模块功能的最新版本，这款革新的软件产品使机械制造师和原始设备制造商(OEM)在使用软件来创建定制的动态控制器时产品功能更强大，并且可在任一NI硬件平台配置。OEM和机械制造师能使用产品提供的大范围的前置动态功能和控制算法来快速基于特定的使用要求创建动态控制器，并能满足价格和产品性能的需求。该新型的NI SoftMotion Development Module 2.1版为步进马达控制器扩展了灵活的开发环境，并针对Windows Vista操作系统增加了新的支持功能，且为高性能的动态控制器提供了新的NI CompactRIO控制器功能。  NI动态控制开发与研究部主管Robert Canik表示：“该NI SoftMotion Development模块让设计者创建最好的控制系统，而且避免了定制产品的成本。”  该NI SoftMotion Development模块产品对于那些需要满足高速或传统控制形式的应用而言是一种理想的选择，比如用于钻井、半导体加工、微型电气机械加工和在线的工具生产序列等。机械制造师和OEM能使用NI SoftMotion Development模块来容易的创建动态控制器，并且控制器具有先进的控制算法功能，比如为得到更好的机械性能而采用的模糊逻辑或基于模型的控制器等。 ::::::English Description::::::The NI SoftMotion Development Module for LabVIEW is for machine builders and OEMs creating custom motion controllers for better machine performance, and for researchers implementing advanced motion control design algorithms using National Instruments CompactRIO, plug-in DAQ modules, plug-in R Series devices, or Compact FieldPoint. Enables custom motion control system development in software Includes LabVIEW VIs for trajectory generation, spline interpolation, position/velocity control, and encoder implementation on FPGA Works with NI CompactRIO, Compact FieldPoint, and plug-in R Series and M Series DAQ devices Is ideal for machine builders, OEMs, and researchers Product:NI SoftMotion Development Module 2.1 Lanaguage:English Platform:/WinNT/2000/XP Size:53MB

::::::English Description:::::: Vision Acquisition Software Software to Acquire, Save, and Display Images Compatible with LabVIEW, C/C++, Visual Basic, and .NET Included with the Vision Development Module and Vision Builder AI Acquire, save, and display images from thousands of different cameras Works with NI frame grabbers and IEEE 1394 cameras (GigE Vision support coming soon!) Included with all NI Vision frame grabbers and IEEE 1394 interface devices Product:NI vision 8.5 Acquisition Software Lanaguage:english Platform:Winxp/Win7 Size:702MB

NI Vision 8.5 supports LabVIEW 7.1 or later, Visual Studio 6.0 or later, and LabWindows™/CVI™ 7.0 or later. The installer specifically allows side-by-side installations of NI Vision 8.5 for each of the supported versions of LabVIEW, enabling you to use the NI Vision 8.5 Development Module with multiple versions of LabVIEW. National Instruments recommends that you install LabVIEW, or any other supported development environment, before installing the NI Vision 8.5 Development Module. NOTE: The NI Vision 8.5 Development Module overwrites existing NI-IMAQ examples, NI Vision examples, and NI Vision VIs. Move modified examples or VIs that you want to save to another directory before installing the NI Vision 8.5 Development Module. For installation instructions and a complete list of system...

LabVIEW NI SoftMotion offers the convenience of programming your motion profiles with a high-level function block API based on the Motion Control Library defined by PLCopen including function blocks for straight-line, arc, and contoured move types as well as function blocks for advanced operations like electronic gearing and camming. LabVIEW NI SoftMotion also features advanced functions for custom motion application design including trajectory generation, spline interpolation, position and velocity control, and encoder implementation. By combining LabVIEW NI SoftMotion with the new NI C Series drive interface modules for CompactRIO, you can take advantage of the RIO Scan Interface for simplified application development for single-axis and multiaxis coordinated motion. For applications that require functionality or features that are not available with...

National Instruments DIAdem is software for managing, analyzing, and reporting data collected during data acquisition and/or generated during simulations. NI DIAdem is designed to help you make informed decisions and meet the demands of today’s testing environments, which require quick access to large volumes of scattered data, consistent reporting, and data visualization. The DIAdem DataFinder, which is optimized for managing data from multiple sources and different formats, helps you correlate data based on its descriptive attributes – functionality previously reserved for only those with a customized data management system.Product:NI DIAdem 10.2 Lanaguage:english Platform:Winxp/Win7 Size:273MB

OverviewToday’s complex integrated circuit (IC) designs generate a vast amount of simulation data. CosmosScope™ turns that mountain of data into useful information. With powerful analysis and measurement capabilities, patented waveform-calculator technology, and scripting language based on the industry standard Tcl/Tk, CosmosScope offers unparalleled capability and flexibility to analyze design performance and ensure design quality. CosmosScope supports all Synopsys simulators: HSPICE®, NanoSim™, Saber® and SaberHDL. CosmosScope benefits * Supports all Synopsys simulation products with a single viewer including HSPICE, NanoSim Saber, and SaberHDL * Provides powerful Tcl/Tk-based scripting language for easy customization * Performs post-processing of analog and digital simulation results * Automatically annotates graphs with design information using true WYSIWYG graphics, including arrows, shapes and text * Annotates graphs with...

As technology feature sizes shrink, conductors get smaller, and supply voltages reduce, the corresponding current per scaled feature size increases exponentially. These changes cause power-rail IR (voltage) drop and electromigration (EM) effects that significantly degrade performance and might cause the circuit to malfunction. To eliminate such problems, Astro-Rail™ provides an accurate and design-stage comprehensive sign-off solution for power consumption, IR drop and EM analysis for advanced-technology designs. Astro-Rail is an important component of Synopsys?Milkyway™-based Galaxy™ solution. Using Synopsys?proprietary Dynamic-Macromodeling™ technology, Astro-Rail assists in reducing time to market and ensures reliability. In Astro-Rail, IR drop and EM analysis of million gate designs are completed in minutes. Astro-Rail provides sign-off quality analysis results within five percent tolerance of HSPICE® with Star-RCXT™ parasitic...

:::::English Description::::::Synopsys?JupiterXT™ design planning solution enables fast feasibility analysis for a preview of implementation results, and provides detailed floor planning capabilities for flat or hierarchical physical design implementation styles. Project leaders and physical designers of ASIC or COT designs benefit from the accurate prediction and production-proven convergence JupiterXT provides. Feasibility analysis is supported for incomplete netlists in the form of black boxes or early gate level netlists. Powerful placement algorithms incorporate designers?knowledge of black box content and produce routable floorplan results using autoshaping with full rectilinear support. If gate netlists are available, the placement algorithms apply a virtual flat approach that places hard macros and standard cells simultaneously. As more detailed design content is added to netlists as a result...

Synopsys, Inc. today announced that UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs that utilize the Synopsys DFT MAX scan compression automation solution. Rapid yield learning depends on the accuracy and efficiency of failure analysis, a manually intensive and time-consuming process of identifying the individual circuit in a design that could cause a device to fail. Using Synopsys TetraMAX diagnostics to perform this task automatically on DFT MAX-compressed scan patterns, UMC engineers were able to substantially decrease the time and effort required for failure analysis. \”As part of UMC\’s leading-edge manufacturing products and services, we are continuing to build upon our portfolio of robust rapid learning tools,\” said S. R. Sheu, Product Engineering Director at UMC....