Tags :Design-For-Test（DFT）v9.1

Mentor Graphics Corporation (Nasdaq: MENT) today announced that STMicroelectronics has adopted the TestKompress® automatic test pattern generation (ATPG) product into its standard 65nm and 45nm design kits. The new test flow will enable high-quality scan-based production testing for applications such as automotive, cellular infrastructure, and imaging. “We’re benefiting from a very fruitful collaboration to incorporate Mentor Graphics’ Design-For-Test (DFT) technology into our advanced nanometer design flows starting at 65nm and below,” said Roberto Mattiuzzo, Digital Test Solutions manager of STMicroelectronics’ Technology R&D, Central CAD & Design Solutions. “With new failure mechanisms at advanced nodes, limitations on IC pins available for testing, and the need to employ better self-test in the field, the range of emerging testing requirements has significantly increased....