Tags :IC-CAP 2009

The Integrated Circuit Characterization & Analysis Program (IC-CAP) is the industry standard platform for DC and High Frequency measurement and modeling of semiconductor devices. IC-CAP 2009 continues to provide innovative modeling solutions by introducing two new turn-key modeling packages for extracting Corner Models for MOS devices and the BSIMSOI4 model for Silicon On Insulator (SOI) MOS devices. For the first time, IC-CAP 2009 adopts a new platform and user interface (UI) technology which dramatically improves the performance, responsiveness and provides a better look-and-feel of the product. In addition, this new release introduces several platform enhancements in the areas of PEL, graphics and instrument drivers. New Corner Modeling Extraction Package Unlike extracted models from measured data, which describe the behavior of...

The Integrated Circuit Characterization & Analysis Program (IC-CAP) is the industry standard platform for DC and High Frequency measurement and modeling of semiconductor devices. IC-CAP 2009 Update 1 continues to provide innovative modeling solutions by introducing several new model versions in MOS extraction packages as well as other enhancements and new features. The new model versions include HiSIM_HV 1.1.1, BSIM 4.6.2, and PSP 103.0. IC-CAP 2008 introduced running simulations in Spectre compatibilty mode with ADS, thus enhancing model generation and library maintainance efficiency, and IC-CAP 2009 Update 1 now introduces support for running ADS simulations in HSPICE compatibilty mode. Addition of a driver for the new B1505A Power Device Analyzer and Curve Tracer makes it possible to measure a new...