Tags :Tessent 2013

Tessent combines features of deterministic scan testing, embedded pattern compression, built-in self test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. The Tessent product suite provides comprehensive silicon test and yield analysis solutions that address the challenges of manufacturing test, debug, and yield ramp for today’s SoCs. Built on the foundation of the best-in-class solutions for each test discipline, Tessent brings them together in a powerful test flow that ensures total chip coverage.Tessent® MemoryBIST provides a complete solution for at-speed testing, diagnosis, and repair of embedded memories. The solution’s architecture is hierarchical, allowing BIST and self-repair capabilities to be added to individual cores as well as at the top level. Tessent...