Tags :TetraMAX

Synopsys, Inc. today announced that UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs that utilize the Synopsys DFT MAX scan compression automation solution. Rapid yield learning depends on the accuracy and efficiency of failure analysis, a manually intensive and time-consuming process of identifying the individual circuit in a design that could cause a device to fail. Using Synopsys TetraMAX diagnostics to perform this task automatically on DFT MAX-compressed scan patterns, UMC engineers were able to substantially decrease the time and effort required for failure analysis. \”As part of UMC\’s leading-edge manufacturing products and services, we are continuing to build upon our portfolio of robust rapid learning tools,\” said S. R. Sheu, Product Engineering Director at UMC....